See theīasic_Transient.emp project in the AWR Microwave Officeįor frequency domain measurements, the maximum step size is typicallyġ/(25*FH), where FH is the highest significant harmonic frequency. Large time constants, relative to the frequency of operation, so it may beĭifficult to notice the difference between periods. Note that circuits can contain elements with very Steady state is reached when the behavior of the circuit is identical from For more information, see the Help associated with these Measurements (for example, Vfft and Pspec), and the period is determinedįrom the results. Oscillating circuits, there is a set of FFT-based frequency domain Another way toĭescribe the period is T=1/F0 where F0 is the largest frequency such thatĮvery stimulus frequency is an integer multiple of it i.e. Value that is an integer multiple of every stimulus period. Simulation of circuits that do not oscillate for these, the period is aįunction of the input stimulus frequency(ies).
Cst microwave studio rise time settings full#
The full set of frequency domain measurements are available for transient Well-resolved, steady-state time domain results. Measurements from transient simulations require at least one period of Vharm (and others that are dependent on them, like PAE and IPn) are calculated fromįourier transforms of the transient analysis results. Frequency domain measurements such as Pcomp and Smaller time steps) during transient events. Transient simulator options forces the simulator to be more conservative (take Tightening the accuracy requirements specified in the Resolution of the results is clearly indicated in the graph by the waveform of the Transient effects such as rise and fall time, or overshoot, the time domain Take smaller steps when transient events occur. Transient analysis improve measurement accuracy. Itime are extracted directly from the raw analysis results. If specified) at each time point in the analysis, so measurements like Vtime and Transient analysis saves node voltages and branch currents (and capacitor charges, 7.1.1. Measurements Using Transient Analysis Simulators